| 型號(hào) | 下載 訂購(gòu) | 功能描述 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
絲印：SC32SEP；Package：TSSOP；SN54SC4T32-SEP Radiation Tolerant, Quadruple 2-Input Positive-OR Gates With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23629-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件：1.81373 Mbytes 頁(yè)數(shù)：24 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC32SEP；Package：TSSOP；SN54SC4T32-SEP Radiation Tolerant, Quadruple 2-Input Positive-OR Gates With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23629-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件：1.81373 Mbytes 頁(yè)數(shù)：24 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC32SEP；Package：TSSOP；SN54SC4T32-SEP Radiation Tolerant, Quadruple 2-Input Positive-OR Gates With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23629-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件：1.81373 Mbytes 頁(yè)數(shù)：24 Pages | TI 德州儀器 | TI |
| 供應(yīng)商 | 型號(hào) | 品牌 | 批號(hào) | 封裝 | 庫(kù)存 | 備注 | 價(jià)格 |
|---|---|---|---|---|---|---|---|
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
原廠授權(quán)代理,專注軍工、汽車、醫(yī)療、工業(yè)、新能源！ |
詢價(jià) | ||
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
詢價(jià) | |||
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
詢價(jià) | |||
TI |
25+ |
32-VQFN(5x5) |
20948 |
樣件支持,可原廠排單訂貨! |
詢價(jià) | ||
TI |
25+ |
32-VQFN(5x5) |
21000 |
正規(guī)渠道,免費(fèi)送樣。支持賬期,BOM一站式配齊 |
詢價(jià) | ||
TI/德州儀器 |
25+ |
原廠封裝 |
11000 |
詢價(jià) | |||
TI/德州儀器 |
25+ |
原廠封裝 |
9999 |
詢價(jià) |
相關(guān)芯片絲印
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