| 型號 | 下載 訂購 | 功能描述 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
絲印:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.06467 Mbytes 頁數(shù):28 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.06507 Mbytes 頁數(shù):28 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.06507 Mbytes 頁數(shù):28 Pages | TI 德州儀器 | TI | ||
絲印:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.15731 Mbytes 頁數(shù):30 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP(PW);SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.12677 Mbytes 頁數(shù):29 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP(PW);SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.12677 Mbytes 頁數(shù):29 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP(PW);SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.12677 Mbytes 頁數(shù):29 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.15731 Mbytes 頁數(shù):30 Pages | TI 德州儀器 | TI | ||
絲?。?strong>SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.06467 Mbytes 頁數(shù):28 Pages | TI 德州儀器 | TI | ||
絲印:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1 Features ? Vendor item drawing available, VID V62/23632-01XE ? Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) ? Single-event effects (SEE) characterized: – Single event latch-up (SEL) 文件:1.06507 Mbytes 頁數(shù):28 Pages | TI 德州儀器 | TI |
| 供應(yīng)商 | 型號 | 品牌 | 批號 | 封裝 | 庫存 | 備注 | 價格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
N/A |
22360 |
樣件支持,可原廠排單訂貨! |
詢價 | ||
TI |
25+ |
N/A |
22412 |
正規(guī)渠道,免費(fèi)送樣。支持賬期,BOM一站式配齊 |
詢價 | ||
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
原廠授權(quán)代理,專注軍工、汽車、醫(yī)療、工業(yè)、新能源! |
詢價 | ||
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
詢價 | |||
TI/德州儀器 |
25+ |
原廠封裝 |
11000 |
詢價 | |||
TI/德州儀器 |
25+ |
原廠封裝 |
10280 |
詢價 | |||
24+ |
N/A |
58000 |
一級代理-主營優(yōu)勢-實惠價格-不悔選擇 |
詢價 | |||
Texas Instruments |
22+ |
CDIP |
8652 |
軍用單位指定合供方/只做原裝,正品現(xiàn)貨 |
詢價 | ||
TI德州儀器 |
22+ |
24000 |
原裝正品現(xiàn)貨,實單可談,量大價優(yōu) |
詢價 | |||
24+ |
3000 |
自己現(xiàn)貨 |
詢價 |
相關(guān)芯片絲印
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