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          首頁 >絲印反查>SC08SEP

          型號(hào)下載 訂購功能描述制造商 上傳企業(yè)LOGO

          SN54SC4T08MPWTSEP

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:974.55 Kbytes 頁數(shù):25 Pages

          TI

          德州儀器

          SN54SC4T08MPWTSEP

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:1.030589 Mbytes 頁數(shù):26 Pages

          TI

          德州儀器

          SN54SC4T08MPWTSEP.A

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:1.030589 Mbytes 頁數(shù):26 Pages

          TI

          德州儀器

          V62/23620-01XE

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:974.55 Kbytes 頁數(shù):25 Pages

          TI

          德州儀器

          V62/23620-01XE

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:1.030589 Mbytes 頁數(shù):26 Pages

          TI

          德州儀器

          V62SLASH23620-01XE

          絲?。?strong>SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:974.55 Kbytes 頁數(shù):25 Pages

          TI

          德州儀器

          V62SLASH23620-01XE

          絲印:SC08SEP;Package:TSSOP;SN54SC4T08-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Quadruple 2-Input Positive-AND Gates With Integrated Translation

          1 Features ? Vendor item drawing available, VID V62/23620 ? Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) ? Single-event effects (SEE) characterized: – Single event latch-up

          文件:1.030589 Mbytes 頁數(shù):26 Pages

          TI

          德州儀器

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          TI/德州儀器
          25+
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          10280
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          16-TSSOP
          20948
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          16-TSSOP
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          更多SC08SEP供應(yīng)商 更新時(shí)間2026-1-18 15:15:00
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