SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

文件：538.37 Kbytes 頁(yè)數(shù)：30 Pages

TI

德州儀器

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes 頁(yè)數(shù)：28 Pages

TI

德州儀器

具有 4 位識(shí)別總線掃描控制的 TAP 合并器的掃描路徑連接器

The 'ACT8997 are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.The 'ACT8997 enhance the scan capability of TI's SCOPETM family by allowing augmentation of a system's primary scan path ·Members of the Texas Instruments SCOPETM Family ofTestability Products·Compatible With the IEEE Standard 1149.1-1990 (JTAG) SerialTest Bus·Allow Partitioning of System Scan Paths·Can Be Cascaded Horizontally or Vertically·Select Up to Four Secondary Scan Paths to Be Included in aPrimary Scan Path·I;

TI

德州儀器

絲印：ACT8997；Package：SOIC；SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

文件：538.37 Kbytes 頁(yè)數(shù)：30 Pages

TI

德州儀器

絲?。?a target="_blank" title="Marking" href="/act8997/marking.html">ACT8997；Package：SOIC；SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

文件：538.37 Kbytes 頁(yè)數(shù)：30 Pages

TI

德州儀器

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes 頁(yè)數(shù)：28 Pages

TI

德州儀器

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes 頁(yè)數(shù)：28 Pages

TI

德州儀器

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes 頁(yè)數(shù)：28 Pages

TI

德州儀器

Package：28-SOIC（0.295"，7.50mm 寬）；包裝：卷帶（TR）剪切帶（CT）Digi-Reel? 得捷定制卷帶 類別：集成電路（IC） 專用邏輯器件 描述：IC SCAN-PATH LINKER 28-SOIC

TI

德州儀器

Package：28-SOIC（0.295"，7.50mm 寬）；包裝：卷帶（TR）剪切帶（CT）Digi-Reel? 得捷定制卷帶 類別：集成電路（IC） 專用邏輯器件 描述：IC SCAN-PATH LINKER 28-SOIC

TI

德州儀器