首頁(yè) >SCAN921025>規(guī)格書列表
| 型號(hào) | 下載 訂購(gòu) | 功能描述 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
絲印：SCAN921025HSM；Package：NFBGA(NZA)；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? High Temperature Operation to 125°C ? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode ? Clock Recovery from PLL Lock to Random Data Patterns ? Ensured Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.10383 Mbytes 頁(yè)數(shù)：32 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025hsm/marking.html">SCAN921025HSM；Package：NFBGA(NZA)；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? High Temperature Operation to 125°C ? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode ? Clock Recovery from PLL Lock to Random Data Patterns ? Ensured Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.10383 Mbytes 頁(yè)數(shù)：32 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025hsm/marking.html">SCAN921025HSM；Package：NFBGA(NZA)；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? High Temperature Operation to 125°C ? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode ? Clock Recovery from PLL Lock to Random Data Patterns ? Ensured Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.10383 Mbytes 頁(yè)數(shù)：32 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025hsm/marking.html">SCAN921025HSM；Package：NFBGA(NZA)；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? High Temperature Operation to 125°C ? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode ? Clock Recovery from PLL Lock to Random Data Patterns ? Ensured Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.10383 Mbytes 頁(yè)數(shù)：32 Pages | TI 德州儀器 | TI | ||
絲印：SCAN921025HSM；Package：NFBGA(NZA)；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? High Temperature Operation to 125°C ? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode ? Clock Recovery from PLL Lock to Random Data Patterns ? Ensured Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.10383 Mbytes 頁(yè)數(shù)：32 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025slc/marking.html">SCAN921025SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. ? Clock Recovery From PLL Lock to Random Data Patterns. ? Specified Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.06904 Mbytes 頁(yè)數(shù)：30 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025slc/marking.html">SCAN921025SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. ? Clock Recovery From PLL Lock to Random Data Patterns. ? Specified Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.06904 Mbytes 頁(yè)數(shù)：30 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025slc/marking.html">SCAN921025SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. ? Clock Recovery From PLL Lock to Random Data Patterns. ? Specified Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.06904 Mbytes 頁(yè)數(shù)：30 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/scan921025slc/marking.html">SCAN921025SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2? IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. ? Clock Recovery From PLL Lock to Random Data Patterns. ? Specified Transition Every Data Transfer Cycle ? Chipset (Tx + Rx) Power Consumption 文件：1.06904 Mbytes 頁(yè)數(shù)：30 Pages | TI 德州儀器 | TI | ||
SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：906.75 Kbytes 頁(yè)數(shù)：27 Pages | TI 德州儀器 | TI |
詳細(xì)參數(shù)
- 型號(hào)：
SCAN921025
- 制造商：
NSC
- 制造商全稱：
National Semiconductor
- 功能描述：
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1(JTAG) and at-speed BIST
| 供應(yīng)商 | 型號(hào) | 品牌 | 批號(hào) | 封裝 | 庫(kù)存 | 備注 | 價(jià)格 |
|---|---|---|---|---|---|---|---|
NS |
25+ |
BGA |
1196 |
大量現(xiàn)貨庫(kù)存,提供一站式服務(wù)! |
詢價(jià) | ||
NSC |
2016+ |
BGA49 |
6000 |
只做原裝,假一罰十,公司可開(kāi)17%增值稅發(fā)票! |
詢價(jià) | ||
24+ |
3000 |
自己現(xiàn)貨 |
詢價(jià) | ||||
NATIONALSEM |
24+ |
原裝進(jìn)口原廠原包接受訂貨 |
200 |
原裝現(xiàn)貨假一罰十 |
詢價(jià) | ||
NSC |
25+ |
SSOP16 |
18000 |
原廠直接發(fā)貨進(jìn)口原裝 |
詢價(jià) | ||
原廠正品 |
23+ |
BGA |
5000 |
原裝正品,假一罰十 |
詢價(jià) | ||
NSC |
23+ |
NA |
1380 |
專做原裝正品,假一罰百! |
詢價(jià) | ||
NCS |
25+23+ |
BGA |
22671 |
絕對(duì)原裝正品全新進(jìn)口深圳現(xiàn)貨 |
詢價(jià) | ||
TexasInstruments |
18+ |
ICSERIALIZER10BIT49FBGA |
6800 |
公司原裝現(xiàn)貨/歡迎來(lái)電咨詢! |
詢價(jià) | ||
TI |
三年內(nèi) |
1983 |
只做原裝正品 |
詢價(jià) |
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