36V/24V/19V High Efficiency Step-Up LED Driver with PWM Control

Features ? Wide output range: up to 10 series LEDs ? Integrated 40V high current switch (800mA limit) ? High efficiency PWM converter (up to 90) ? Low 200mV feedback voltage ? High accuracy across full load range ? VIN range: 2.7V to 5.5V ? LED open-circuit (OVP) protection ? KTD251: 36

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KINETIC

芯凱電子

Surface Mount Schottky Barrier Rectifier

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VISHAYVishay Siliconix

威世威世科技公司

Surface Mount Schottky Barrier Rectifier

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VISHAYVishay Siliconix

威世威世科技公司

Surface Mount Schottky Barrier Rectifiers

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WEITRON

SCHOTTKY BARRIER RECTIFIERS

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CTC

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包裝：盒 類別：光學(xué)檢測設(shè)備 配件 描述：BASIC MODULE W/ 150MM WD

Excelitas Technologies

Agilent B1500A Semiconductor Device Analyzer

Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a wafer in conjunction with a semiautomatic wafer prober. Because the

文件：300.78 Kbytes 頁數(shù)：23 Pages

HP

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Agilent B1500A Semiconductor Device Analyzer

Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a wafer in conjunction with a semiautomatic wafer prober. Because the

文件：300.78 Kbytes 頁數(shù)：23 Pages

HP

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Agilent B1500A Semiconductor Device Analyzer

Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a wafer in conjunction with a semiautomatic wafer prober. Because the

文件：300.78 Kbytes 頁數(shù)：23 Pages

HP

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Agilent B1500A Semiconductor Device Analyzer

Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a wafer in conjunction with a semiautomatic wafer prober. Because the

文件：300.78 Kbytes 頁數(shù)：23 Pages

HP

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