絲?。?strong>ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ? Family of Testability Products Members of the Texas Instruments Widebus? Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 頁數(shù)：42 Pages

TI

德州儀器

絲?。?strong>ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ? Family of Testability Products Members of the Texas Instruments Widebus? Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 頁數(shù)：42 Pages

TI

德州儀器

絲?。?strong>ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ? Family of Testability Products Members of the Texas Instruments. Widebus? Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Mult

文件：858.09 Kbytes 頁數(shù)：41 Pages

TI

德州儀器

絲?。?strong>ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ? Family of Testability Products Members of the Texas Instruments Widebus? Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 頁數(shù)：42 Pages

TI

德州儀器