| 型號 | 下載 訂購 | 功能描述 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
絲?。?a target="_blank" title="Marking" href="/abt18504/marking.html">ABT18504；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ 文件：716.62 Kbytes 頁數(shù)：35 Pages | TI 德州儀器 | TI | ||
絲印：ABT18504；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ 文件：716.62 Kbytes 頁數(shù)：35 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18504/marking.html">ABT18504；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ 文件：716.62 Kbytes 頁數(shù)：35 Pages | TI 德州儀器 | TI | ||
絲印：ABT18640；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru 文件：512.64 Kbytes 頁數(shù)：30 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18640/marking.html">ABT18640；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru 文件：512.64 Kbytes 頁數(shù)：30 Pages | TI 德州儀器 | TI | ||
絲印：ABT18646；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for 文件：437.67 Kbytes 頁數(shù)：16 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18646/marking.html">ABT18646；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for 文件：437.67 Kbytes 頁數(shù)：16 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18646/marking.html">ABT18646；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for 文件：437.67 Kbytes 頁數(shù)：16 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18652/marking.html">ABT18652；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for 文件：438.5 Kbytes 頁數(shù)：16 Pages | TI 德州儀器 | TI | ||
絲?。?a target="_blank" title="Marking" href="/abt18652/marking.html">ABT18652；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for 文件：438.5 Kbytes 頁數(shù)：16 Pages | TI 德州儀器 | TI |
詳細(xì)參數(shù)
- 型號：
ABT18
- 制造商：
TI
- 制造商全稱：
Texas Instruments
- 功能描述：
WITH 18-BIT TRANSCEIVER AND REGISTER
| 供應(yīng)商 | 型號 | 品牌 | 批號 | 封裝 | 庫存 | 備注 | 價格 |
|---|---|---|---|---|---|---|---|
TI |
24+ |
QFP-64 |
3650 |
詢價 | |||
ANCHORBA |
16+ |
BGA |
2500 |
進(jìn)口原裝現(xiàn)貨/價格優(yōu)勢! |
詢價 | ||
ANCHORBAY |
0939+ |
BGA |
40 |
原裝現(xiàn)貨海量庫存歡迎咨詢 |
詢價 | ||
ANCHORBAY |
23+ |
NA |
236 |
專業(yè)電子元器件供應(yīng)鏈正邁科技特價代理特價，原裝元器件供應(yīng)，支持開發(fā)樣品 |
詢價 | ||
ANCHORBA |
23+ |
BGAQFP |
8659 |
原裝公司現(xiàn)貨!原裝正品價格優(yōu)勢. |
詢價 | ||
ANCHORBA |
BGAQFP |
6688 |
15 |
現(xiàn)貨庫存 |
詢價 | ||
ANCHORBAY |
ROHS+Original |
NA |
236 |
專業(yè)電子元器件供應(yīng)鏈/QQ 350053121 /正納電子 |
詢價 | ||
ANCHORB |
25+ |
BGA |
30000 |
代理全新原裝現(xiàn)貨,價格優(yōu)勢 |
詢價 | ||
ANCHORBA |
23+ |
BGA316 |
50000 |
全新原裝正品現(xiàn)貨,支持訂貨 |
詢價 | ||
ABT |
23+ |
BGA |
50000 |
全新原裝正品現(xiàn)貨,支持訂貨 |
詢價 |
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