| 型號 | 下載 訂購 | 功能描述 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
絲?。?strong>ABT16823；Package：CFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru 文件：868.21 Kbytes 頁數：38 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：TSSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru 文件：868.21 Kbytes 頁數：38 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：TSSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：TSSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲印：ABT16823；Package：TSSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：SSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲印：ABT16823；Package：SSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：SSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：SSOP；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation High-Impedance State During Power Up and Power Down ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R 文件：781.19 Kbytes 頁數：22 Pages | TI 德州儀器 | TI | ||
絲?。?strong>ABT16823；Package：TSSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru 文件：868.21 Kbytes 頁數：38 Pages | TI 德州儀器 | TI |
| 供應商 | 型號 | 品牌 | 批號 | 封裝 | 庫存 | 備注 | 價格 |
|---|---|---|---|---|---|---|---|
TexasInstruments |
18+ |
IC18BITINVBUSTXRX56-TSSO |
6580 |
公司原裝現貨/歡迎來電咨詢! |
詢價 | ||
Texas Instruments |
24+ |
56-TSSOP |
56200 |
一級代理/放心采購 |
詢價 | ||
TI |
25+ |
SSOP-56 |
1001 |
就找我吧!--邀您體驗愉快問購元件! |
詢價 | ||
TI |
22+ |
56TSSOP |
9000 |
原廠渠道,現貨配單 |
詢價 | ||
Texas Instruments |
25+ |
56-TFSOP(0.240 6.10mm 寬) |
9350 |
獨立分銷商 公司只做原裝 誠心經營 免費試樣正品保證 |
詢價 | ||
TI |
25+ |
56-TSSOP |
18746 |
樣件支持,可原廠排單訂貨! |
詢價 | ||
TI |
25+ |
56-TSSOP |
18798 |
正規(guī)渠道,免費送樣。支持賬期,BOM一站式配齊 |
詢價 | ||
PHI |
00+ |
TSSOP14 |
68 |
全新原裝100真實現貨供應 |
詢價 | ||
PHI |
24+ |
TSSOP14 |
25843 |
公司原廠原裝現貨假一罰十!特價出售!強勢庫存! |
詢價 | ||
PHI |
25+ |
TSSOP14 |
991 |
⊙⊙新加坡大量現貨庫存,深圳常備現貨!歡迎查詢!⊙ |
詢價 |
相關芯片絲印
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更多- SN74ABT16825DL.B
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- SN74ABT245BDW.B
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- SN74ABT374ADW
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- SN74ABT374ADWRE4
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